NEX DE VS
NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer. Variable small spot plus camera EDXRF for elemental analysis. As a premium high performance, SMALL SPOT benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, slurries and RoHS materials.
Multi-position, small spot & bulk elemental analysis. New Rigaku NEX DE VS elemental analyzer (EDXRF) offers multi-position bulk analysis in addition to a large single position sample stage, with three analysis spot size options — 1 mm, 3 mm and 10 mm — that are easily changeable by the system's automatic collimators. A high resolution camera and LED lighting system allows a sample's image to be recorded via the Windows software interface.
Product Information
Analyze ₁₁Na to ₉₂U non-destructively
Powerful QuantEZ Windows®-based software
High resolution camera
1, 3 or 10 mm analysis spot size
Solids, liquids, alloys, powders and films
60kV X-ray tube for wide elemental coverage
FAST SDD® detector for superior data
Six automated tube filters
Unmatched performance-to-price ratio
Optional RPF-SQX fundamental parameters
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Alexander Fogh
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +45 81 88 49 08
- Email: asf@ramcon.dk
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Amalie Kofoed Jørgensen
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +45 50 60 05 15
- Email: akj@ramcon.dk
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Christian Hansson
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +46 70 231 40 71
- Email: ch@ramcon.se