XT H 225 ST 2x
Productivity without compromise. The integration of industry-leading features into the XT H 225 ST 2x microfocus X-ray CT system allows a doubling of data acquisition speed and hence of inspection productivity. It is a result of using advanced detector technology combined with new functionality including Half.Turn CT and Rotating.Target 2.0.
Product Information
Rotating.Target 2.0
Local.Calibration
Auto.Filament Control
Quick.Change
Half.Turn CT
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Christian Clement
- Arbetsområde: Sälj & Application
- Specialområde: Microscopy
- Tel. +45 81 77 71 16
- Email: cc@ramcon.dk