MiniFlex
BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT. Qualitative and quantitative phase analysis of poly-crystalline materials. The sixth generation MiniFlex benchtop X-ray diffractometer is a multipurpose powder diffraction analytical instrument that can determine: crystalline phase identification (phase ID) and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to the MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex XRD system decades ago.
Product Information
New 6th generation design
Compact, fail-safe radiation enclosure
Incident beam variable slit
Simple installation and user training
Factory aligned goniometer system
Laptop computer operation
Relaterade produkter
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Alexander Fogh
- Arbetsområde: Sälj & Application
- Specialområde: Material Characterization
- Tel. +45 81 88 49 08
- Email: asf@ramcon.dk
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Amalie Kofoed Jørgensen
- Arbetsområde: Sälj & Application
- Specialområde: Material Characterization
- Tel. +45 50 60 05 15
- Email: akj@ramcon.dk
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Christian Hansson
Product Specialist
- Arbetsområde: Sälj & Application
- Specialområde: Material Characterization
- Tel. +46 70 231 40 71
- Email: ch@ramcon.se