NEX CG II Series

Leverantör Rigaku

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Next-Generation Cartesian Geometry Energy Dispersive X‑ray Fluorescence Spectrometers
Available models are NEX CG II for excellent spectral resolution for trace peaks or NEX CG II+ for more demanding applications requiring a higher-powered system.

Enhanced elemental analysis for industrial quality control to advanced research applications. NEX CG II Series are powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometers that deliver rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types—from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.

The Rigaku NEX CG II Series are multi-element, multi-purpose analyzers, ideal for measuring ultra-low and trace element concentrations into the percent levels. These analyzers serve many industries and are especially well-suited for semi-quantitative determination of elemental content in complete unknowns. Applications range from industrial and in-plant quality assurance to research and development. They are easy to use for non-technical operators yet powerful enough for expert use in commercial labs and R&D facilities. Users can achieve the lowest limits of detection and easily manage complex applications. NEX CG II Series are ideal for testing agricultural soils and plant materials, analyzing finished animal feeds, measuring waste oils, environmental monitoring, pharmaceuticals, cosmetics, and many others.

Non-destructive elemental analysis for sodium (Na) to uranium (U)
Quick elemental analyses of solids, liquids, powders, coatings, and thin films
Indirect excitation for exceptionally low detection limits
High-power X-ray tubes (50 kV 50 W or 65 kV 100 W)
Large-area high-throughput silicon drift detector (SDD)
Analysis in air, helium, or vacuum
Powerful and easy-to-use QuantEZ software with multilingual user interface
Advanced RPF-SQX Fundamentals Parameters software featuring Scattering FP
Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
Various automatic sample changers accommodating up to 52 mm samples
Low cost of ownership

Technique: Indirect excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit: Excel in complex applications with trace elements and variable base matrices; analyze solids, liquids, powders, coatings, and thin films
Technology: 3D Cartesian geometry energy dispersive XRF (EDXRF) using a large-area high-throughput silicon drift detector (SDD)
Attributes: High-power X-ray tube (50 kV 50 W or 65 kV 100 W), large-area high-throughput SDD, analyze Na to U
Software: QuantEZ for control of spectrometer functions and data analysis
Options: Vacuum, helium purge, automatic sample changers, sample spinner tray, external PC with Microsoft Windows operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features
Dimensions: 46.3 (W) x 49.2 (D) x 38.2 (H) cm
Mass: Approx. 65 kg (NEX CG II); approx. 68 kg (NEX CG II+)
Power requirements: 1Ø, 100 – 240 V, 3.8 – 1.6 A (50/60 Hz) or 100 – 240 V, 5.2 – 2.6 A (50/60 Hz)